技术&质量
Technology&Quality
质量管理
Quality control
质量方针:
科学管理 顾客至上 开拓进取 更创新高
MC-POWER SEMICONDUCTOR
HSF方针:
全员参与 持续改进 绿色产品 顾客满意
MC-POWER SEMICONDUCTOR
可靠性实验
Reliability experimen
No. |
Testitems 测试项目 |
Abbv. 简写 |
Reference standard 参考标准 |
Test condition 测试条件 |
Requirements 要求 |
|
Lots/ss per lot 批次数及每批次抽样数量 |
Duration/Accept 持续时间/接受标准 |
|||||
01 |
High Temperature Storage Lifes 高温储存寿命 |
HTSL | JESD22-A103 |
Ta≧150℃ According to product datasheet Tj maximum rating 根据规格书所定义的TJmax |
3*25 | 1000Hrs/0 Fail |
02 |
Temperature Humidity Unbiased 高温高湿储存 |
THU | JESD22-A101 IEC 60749-42 |
Ta=85℃,RH =85% 环境温度85℃,湿度85% |
3*25 | 1000Hrs/0 Fail |
03 |
High Temperature Reverse Bias Test 高温反向偏压 |
HTRB | JESD22-A108 IEC60747-9 |
VR=80-100%VR(max),0.8倍-1倍VR TA=150℃/175℃环境温度150℃/175℃ According to product datasheet Tj maximum rating 根据规格书所定义的TJmax |
3*77 | 1000Hrs/0 Fail |
04 |
High Temperature Gate Bias 高温栅极偏压 |
HTGB | JESD22-A108 IEC60747-9 |
VGE=±20V or 100%rated VGE (+/-方向都需测试,各一半测试样品) VCE =0(shorted)CE短接 TA=150℃/175℃环境温度150℃/175℃ According to product datasheet Tj maximum rating 根据规格书所定义的Tjmax |
3*77 | 1000Hrs/0 Fail |
05 |
High Temperature Reverse Bias Test 高温反向偏压 |
HTRB+负 压 | JESD22-A108 IEC60747-9 |
VR=80-100%VR(max),0.8倍-1倍VR Tj=Tjmax=175°C结温175℃,负压VGS=-10V or others According to product datasheet Tj maximum rating根 据规格书所定义的Tjmax |
3*77 | 1000Hrs/0 Fail |
06 |
High Humidity High Temperature Reverse Bias 高温高湿反向偏压 |
HV-H3TRB | JESD22-A101 IEC60749-5 |
VCE=80-100%of maximum rating 0.8倍-1倍额定值 VGE=0(shorted)GE短接 TA=85℃环境温度85℃ RH=85%湿度85% |
3*77 | 1000Hrs/0 Fail |
07 |
High Humidity High Temperature Bias /Highly Accelerated Temperature and Humidity Stress 高温高湿偏压/高加速应 力测试 |
THB/HAST | JESD22-A101/JESD22- A110 |
Ta=85°C,RH =85%,VR =80%VR,max 环境温度85℃,湿度85%,施加电压=0.8倍VR or Ta=130°C,RH =85%,VR =80%VR,max 环境温度130℃,湿度85%,施加电压=0.8倍VR |
3*77 | 1000Hrs/0 Fail |
08 |
Temperature Cycling 温度循环 |
TC | JESD22-A104 IEC 60068-2-14 |
-65 to+150°C(Tjmax) 低温-65℃,高温150℃ Dwell time≧15 minutes 停留时间15分钟以上 |
3*77 | 1000 Cycles/0 Fail |
09 |
Intermittent Operating Life 间歇性工作寿命 |
IOL | MIL-STD-750 Method1037 |
VGE≥10V Delta T≥100℃温度变化率T≥100℃ Ton,Toff≥30 seconds开通、关断时间30秒以上 |
3*77 | 10–15k cycle/0 Fail |
10 |
Autoclave/Unbiased Highly Accelerated Stress Test 高压锅试验/无偏高加速 应力试验 |
AC/UHAST | JESD22-A102/JESD22- A118 |
Autoclave Ta=121+/-2°C,RH=100%,15psig, 高压锅(温度为121+/-2℃,湿度100%,15个大气 压) or Unbjased HAST130℃、85%RH, 无偏压试验(温度为130℃、湿度为85%RH) |
3*25 | 96Hrs/0 Fail |